December 4, 2019
MEMS and Back-End Inspection
Many devices no longer fall on a grid with the same tolerance as they do on a pre-diced wafer. This type of critical inspection has proven difficult to automate because it demands advanced skills. Up until now, trained operators referenced manufacturing art to make detailed comparisons and complex approximations.
nSpec® addresses these substrate to back-end inspections. Its underlying technology combines hardware control with AI and deep learning–powered software to give human-level intelligence to machine knowledge transfer.