nSpec® LS

overview features specs
nspec® LS

nSpec® LS

Combining optical microscopy, computational super-resolution, artificial intelligence, and robotics, Nanotronics is bringing the world’s most advanced microscope to every manufacturing sector.

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The World's Most Advanced Microscope

The inspection system design allows for easy set up of repeated quality control testing, in addition to settings for single image capture or scans. Configuration options include wafer size, types of defects to be identified, and resolution of scan. Various sample chucks are available to meet specific needs as well as an optional wafer loader.

nSpec® LS

Manual Inspection for:

  • Substrate Wafers
  • Epi Wafers
  • Patterned Wafers
  • Diced Wafers
  • Individual Devices
nSpec® LS

Features

Multiple magnification settings Rapid scanning Wafer mosaicing Customizable defect reports Settings for single image capture and scans Configuration options for wafer size, defect type, and scan resolution Sample chuck sizes to meet specific needs

nSpec® LS

Specifications

  • Travel, typical

    200 mm X and Y direction

  • Precision Lead Screws

    2 mm pitch, preloaded ball screws

  • Centered Load Capability

    2.27 kg

  • Repeatability

    +/- 5 μm

  • Construction

    Precision ground alum plates, Stainless steel raceways

  • Step Size

    0.04 μm

  • Travel Flatness

    30 μm

  • Weight

    5.44 kg

  • Limit Switches

    Mechanical, non-adjustable

  • Wafer Vacuum Chuck (optional)

    Adjustable to 50, 75, 100, 150, 
200, or 300 mm

  • White Illumination:

    LED (other options available)

  • Brightfield/Darkfield Objectives:

    5, 10, 20, or 50x, user selectable

  • Differential Interference Contrast:

    (Normarski)

  • Pixel Size, typical:

    4.54 μm

  • Image Size, typical:

    2752 x 2200 pixels

  • Maximum Frame Rate:

    17.4 fps

  • Stage, Focus, Nosepiece, Illumination, Camera

    Manual user operated