Nanotronics offers sample testing for potential customers interested in purchasing an nSpec® device. This process enables data acquisition from your product to support a return-on-investment decision. Nanotronics delivers a detailed report with scanned data from your samples. Please use this form to share the design-of-experiment details that will guide this data collection and expedite your purchase.





Bare/Epi Wafer:
Patterned Wafer:
Other (Please describe):
Other:
Macro:
Imaging Requirements:
Brightfield:
Darkfield:
DIC:
3D Topography:
AFM:
Sample Map:
Other Reporting Pref.(Please describe):
Current Inspection method:
Test Environment Description:
Contamination/handling requirements:
Estimated throughput requirements:
Estimated lead time for tool acquisition:
Sample 1 Size (mm or in):
Sample 1 Quantity:
Sample 1 Material:
Sample 1 Comments:
Defects, Features/Prop. of Interest 1:
Test Condition Size 1(µm):
Test Condition Description 1:
Sample 2 Size (mm or in):
Sample 2 Quantity:
Sample 2 Material:
Sample 2 Comments:
Defects, Features/Prop. of Interest 2:
Test Condition Size 2(µm):
Test Condition Description 2:
Sample 3 Size (mm or in):
Sample 3 Quantity:
Sample 3 Material:
Sample 3 Comments:
Defects, Features/Prop. of Interest 3:
Test Condition Size 3(µm):
Test Condition Description 3:
Additional Information: